Past Events

• National Level Project Exhibition On Bharathian’s Innovation Day 2020
• Two Week Entrepreneurship Training Programme on E- Vehicle -(2020)
• International Conference On Recent Trends In Electronics And Instrumentation (ICRTEI-2019)
•  “Electromagnetics: Fundamentals, Relevance and Applications (NSEFRA-2018)
• National Seminar on PCB Designing-2017
• Two Days National Workshop on Recent Trends in Electronics and Instrumentation 28-02-2014 to 01-03-2014

M.Sc.

Members of the Board of Studies (Electronics & Instrumentation) - University Department 

Faculty Members

1) Dr.J.Vijayakumar                                    -    Chairperson
    Associate Professor & Head

Antennas and Microwave Laboratory

This laboratory is focusing on the development of Antennas and Microwave devices for various applications (Communications, Sensor, Biomedical etc). The main research activities include four broader areas such as Microwave Electronics, Microwave Materials, Biomedical Electronics and Electromagnetic Engineering.

Bioelectronics

MoUs

• National instruments ---LabVIEW academy program
• AIMAC Innovative and Engineering Private Limited - Research & Students Training Program
• Siemens Limited - collaborative course in B.Voc Mechatronics

M.Sc. Electronics and Instrumentation

Eligibility:

1.A Pass in B.Sc. Electronics / Industrial Electronics / Electronic Science / Electronics and Communication Systems / Physics / B.Sc. Hons / B.Sc. Electrical Equipment Maintenance, Instrumentation / B.E.S. or Equivalent Degree from Foreign University.

2.A Pass in Triple Major (Maths, Physics & Electronics) or (Maths, Electronics & Computer Science).

Head of the Department

Dr. P. Sakthivel

Professor & Head,

Department of Nanoscience & Technology,

Bharathiar University,

Coimbatore, Tamil Nadu - 641 046.

Phone: +91-9677560890

Email: sakthivel.p@buc.edu.in 

Office

Professor & Head,

Department of Textiles & Apparel Design,

Bharathiar University,

Coimbatore, Tamil Nadu - 641 046.

Phone: +91-422-2428424

Email: nanoscience@buc.edu.in

Latest News

 

Past Events

 

Others

 

Atomic force microscopy (AFM)

The Veeco dimension 3100 AFM (AFM) is a magnification instrument capable of measuring the three-dimensional textures of a microscopic region with a horizontal and vertical resolution of a few nanometers. Utilized for mapping the topography of a thin layer with a maximum roughness of a few micrometers. The equipment measures the deflection caused by a sharp tip on a micron-sized cantilever as it scans across the specimen's surface. The instrument's handling range for sample sizes us 1 x 1 m.