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Campus WalkAtomic force microscopy (AFM)
The Veeco dimension 3100 AFM (AFM) is a magnification instrument capable of measuring the three-dimensional textures of a microscopic region with a horizontal and vertical resolution of a few nanometers. Utilized for mapping the topography of a thin layer with a maximum roughness of a few micrometers. The equipment measures the deflection caused by a sharp tip on a micron-sized cantilever as it scans across the specimen's surface. The instrument's handling range for sample sizes us 1 x 1 m.