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Atomic force microscopy (AFM)

The Veeco dimension 3100 AFM (AFM) is a magnification instrument capable of measuring the three-dimensional textures of a microscopic region with a horizontal and vertical resolution of a few nanometers. Utilized for mapping the topography of a thin layer with a maximum roughness of a few micrometers. The equipment measures the deflection caused by a sharp tip on a micron-sized cantilever as it scans across the specimen's surface. The instrument's handling range for sample sizes us 1 x 1 m.

Recognition

M.Sc.

Members of the Board of Studies (Nanoscience and Technology) - University Department 

Faculty Members

1) Dr.N.Ponpandian                               -    Chairperson
    Professor and Head

M.Sc. Nanoscience and Technology

Eligibility:

A pass in B.Sc. in Physics/ Chemistry / Biotechnology/ Biochemistry/ Microbiology,  etc.

Duration: 2 Years

Strength: 25

M.Phil. / Ph.D.,

 

Past Events

RADTECHS 2020

NSRTMP-2018 

PRD 2017

RADTECHS 2015

RADTECHS 2014

RADTECHS 2012

RADTECHS 2011